Automation

Bachelor thesis on sensor technologies for computed tomography receives award

Dr.-Ing.-Siegfried Werth Prize awarded

01.03.2021 - In February, the Dr.-Ing. Siegfried Werth Foundation awarded a prize to a scientific paper in the field of non-contact dimensional metrology at a ceremony held on the premises of Werth Messtechnik in Giessen.

The prize winner is Patrick Steidl for his Bachelor's thesis at the Technical University of Central Hesse, which deals with the development of new sensor technologies for X-ray computer tomography. As the Werth Technology Days, during which the awards are normally presented, had to be cancelled this spring due to the pandemic, the awards ceremony was held in a small circle.

Further prizes were awarded in November 2020 at digital events to scientists from Friedrich Schiller University Jena, the Fraunhofer Institute for Applied Optics and Precision Engineering IOF in Jena and the Technical University of Deggendorf.

Contact

Werth Messtechnik GmbH

Siemensstraße 19
35394 Gießen
Germany

+49 641 7938 0
+49 641 7938 719

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