Join industry experts for a double symposium around Surface metrology from 2pm CET, at the Wiley Analytical Science Conference on November 25, 2020.

In session one, Dr. Uwe Brand will present the state of the art for four different types of instruments: confocal microscopes, coherence scanning interferometry instruments, focus variation microscopes and optical distance sensors on coordinate measuring machines. Routes to support industry in traceable roughness and dimensional metrology will be highlighted together with ideas on how to characterize optical instruments.

Markus Fabich will lead session two, providing insights into the rationale of 5G PCB manufacturing and why this has an impact on the whole business infrastructure. He will discuss the emerging importance of roughness testing of conductor tracks, as well as state-of-the-art inspection workflows for precision roughness testing

Register today on Wiley Analytical Science conference