inspect 04 2017

inspect – the number one magazine for applied imaging and optical metrology: information about new developments, technological trends, groundbreaking applications, new products.

Closing date for ads: 15 August 2017
Contact: Oliver.Scheel@Wiley.com

Preview issue 4:

Trade Shows:
Motek
Embedded Vision Europe

Topics:
Coordinate Measuring Technology
Embedded Vision
X-Ray, Hyperspectral Imaging, IR
 

CONTENT

COVERSTORY
YXLON:  Quality assurance in additive-production using CT

MÄRKTE & MANAGEMENT
Orderfox:  New online database for CNC manufacturer
VDMA:  Perspectives for machine vision

VISION
IDS:  Interview - USB 3.1 – The next generation of camera interface?
MBJ:  Illumination for IR applications
MVTec / Ximea:  Current developments in hyperspectral imaging
Perception Park:  Chemical colour imaging for industrial applications
Xilinx:  FPGAs in embedded vision architectures

AUTOMATION
Siemens:  Object identification and product tracing using optical identification

CONTROL
Fraunhofer:  Applications of industrial X-Ray imaging.
Mitutoyo:  CMM application
Optris:  The “Thermal Fingerprint” –Injection Molding in the Focus of Industry 4.0
Trioptics:  MTF-measurements within the IR range
Volume Graphics:  New software for the simulation of structure mechanics
Werth:  Process validation for plug connectors using optical sensors and computer tomography
Zeiss IMT:  Interview: The interconnected measuring room.

NON MANUFACTURING
Polytec:  Hyperspectral imaging in agriculture

VISION PLACES
inspect:  Events
inspect:  Embedded Vision Europe – Preview
inspect:  Event calender 2017


 

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inspect award 2025

The voting for the inspect award 2025 is open.

Vote now!

Fokus Nachhaltigkeit

Lesen Sie Fachbeiträge, News und Interviews zum Thema

Zur Microsite

Digital tools or software can ease your life as a photonics professional by either helping you with your system design or during the manufacturing process or when purchasing components. Check out our compilation:

Proceed to our dossier