In addition, numerous extensions to characterize the latest generation of image sensors and cameras were added including an extended wavelength range from UV to SWIR, camera characterization with lenses, characterization of polarization and multispectral sensors, a decomposition of spatial nonuniformity into column, row, and pixel variations, and the possibility for a direct comparison of linear and nonlinear cameras. The talk will outline the many new and exciting features of release 4.0, which will make the EMVA 1288 standard significantly more useful.